Nikon’s XT V series includes world-renowned X-ray inspection and CT systems for non-destructive testing of electronic components (PCBs, BGAs, chips, etc.).
With submicron feature recognition, the XT V series of systems meets today’s needs for high-performance nondestructive testing (NDT) of complex electronic components. Nikon’s Xi Nanotech X-ray source, combined with industry-leading industrial flat panel detectors, delivers optimum image quality with seamless transitions between 2D and 3D inspections.
High performance X-ray source
Nikon’s market-leading Xi Nanotech microfocus X-ray source is unique in its unique design with its proprietary integrated generator, unmatched maximum voltage of 160 kV and true target power of 20 W.
Powerful image enhancement
The High.Contrast Filter reveals hidden details in the X-ray image by providing exceptional image quality from low to high contrast areas, all in a single, sharp image. Operators can now identify all the features of the sample faster than ever before, optimizing and increasing their productivity.
Oblique angle concentric imaging
The extreme oblique angle observation field of up to 90°, with 360° sample rotation, maintains the region of interest thanks to intelligent software and hardware solutions.
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