The MM-Series microscopes operate within a digital control system, providing excellent measurement accuracy for industrial in-line and quality assurance applications. The instruments are ideal for inspecting, measuring and verifying both 2D and 3D features across a wide range of components.
Nikon’s CFI60-2 Objective System Capabilities
Nikon’s innovative optics enable clear, high-contrast brightfield, darkfield, polarised (POL) and differential interference contrast (DIC) images for precise, accurate measurement of low contrast features.
Wide Range of Measuring Stages
Six robust stages are available for the MM-800N, ranging from 12” x 8” (300 mm x 200 mm) down to 2” x 2” (50 mm x 50 mm), of which the three smaller stages up to 6″ x 4″ (150 mm x 100 mm) are compatible with the MM-400N.
MM Controller Backpack Interface
LED illumination settings, XY-stage co-ordinates and Z-axis data are transferred to the MM controller and Nikon’s E-Max software on a PC for full data processing and system control.
Robust, Precision Build for Repeatable Accuracy
High precision and repeatability as well as accurate results are guaranteed throughout the long service life of the instruments, supported by an extensive range of optical components and accessories.
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